Commit 7898f31b authored by ChiYuan Huang's avatar ChiYuan Huang Committed by Jonathan Cameron
Browse files

Documentation: ABI: testing: rtq6056: Update ABI docs 



Add documentation for the usage of voltage channel integration time.

Signed-off-by: default avatarChiYuan Huang <cy_huang@richtek.com>
Link: https://lore.kernel.org/r/1658242365-27797-4-git-send-email-u0084500@gmail.com


Signed-off-by: default avatarJonathan Cameron <Jonathan.Cameron@huawei.com>
parent 4396f45d

Documentation/ABI/testing/sysfs-bus-iio

+11 −0
Original line number Diff line number Diff line
@@ -2038,3 +2038,14 @@ Description: 
		Available range for the forced calibration value, expressed as:



		- a range specified as "[min step max]"



What:		/sys/bus/iio/devices/iio:deviceX/in_voltageX_sampling_frequency

What:		/sys/bus/iio/devices/iio:deviceX/in_powerY_sampling_frequency

What:		/sys/bus/iio/devices/iio:deviceX/in_currentZ_sampling_frequency

KernelVersion:	5.20

Contact:	linux-iio@vger.kernel.org

Description:

		Some devices have separate controls of sampling frequency for

		individual channels. If multiple channels are enabled in a scan,

		then the sampling_frequency of the scan may be computed from the

		per channel sampling frequencies.